2019
DOI: 10.1016/j.solmat.2019.109915
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Control of secondary phases and disorder degree in Cu2ZnSnS4 films by sulfurization at varied subatmospheric pressures

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Cited by 36 publications
(9 citation statements)
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“…Figure 2 presents the Raman shift spectra of the CZTS samples synthesized utilizing various TEA concentrations. All of the samples showed peaks at ~288, ~326, and ~338 cm −1 , which were assigned to the CZTS kesterite structure, these values were close to the data reported by other reports 34–36 . Vibration mode of CZTS at ~326 cm −1 corresponds to A1 mode which resulting from the vibrations of S atoms in the CZTS lattice 37,38 .…”
Section: Resultssupporting
confidence: 87%
See 1 more Smart Citation
“…Figure 2 presents the Raman shift spectra of the CZTS samples synthesized utilizing various TEA concentrations. All of the samples showed peaks at ~288, ~326, and ~338 cm −1 , which were assigned to the CZTS kesterite structure, these values were close to the data reported by other reports 34–36 . Vibration mode of CZTS at ~326 cm −1 corresponds to A1 mode which resulting from the vibrations of S atoms in the CZTS lattice 37,38 .…”
Section: Resultssupporting
confidence: 87%
“…All of the samples showed peaks at ~288, ~326, and ~338 cm À1 , which were assigned to the CZTS kesterite structure, these values were close to the data reported by other reports. [34][35][36] Vibration mode of CZTS at ~326 cm À1 corresponds to A1 mode which resulting from the vibrations of S atoms in the CZTS lattice. 37,38 In the samples prepared using 5 mg/mL of TEA, the intense Raman peak located at 338 cm À1 indicated a single-phase CZTS kesterite structure that was attributed to the sulfur's atomic vibrations.…”
Section: Resultsmentioning
confidence: 99%
“…The crystallite size (also termed domain size) D hkl and the observed profiles for the ( hkl ) planes in PLLA film were calculated through the application of Scherrer's equation.where D is the crystallite size, k is the shape factor with a typical value of 0.9, λ is the wavelength of the incident wave (1.5405 Å), β is the broadening of the peak at the full width at half maximum (FWHM) measured on the diffraction profile, and θ is the diffraction angle. 40–42 Since the behavior of the diffraction peaks is similar (first there is a shift of the peaks toward larger diffraction angles from the pristine sample (0 h) to the treated sample at 12 h, and then a slight shift to smaller angles (Fig. 2, inset)), the crystallite size was calculated only for the 200/110 plane.…”
Section: Resultsmentioning
confidence: 99%
“…The use of modern methods such as Raman scattering spectroscopy (RS), X-ray diffraction (XRD), and scanning electron and atomic force microscopies (SEM and AFM) can help to understand a lack or excess of elements (Cu, Sn, Zn, S, and Se), an influence on the crystal lattice, as well as morphology, structure, and optical and electrical properties of the absorber. Furthermore, the Raman spectrum reflects the symmetry of the crystal structure, the strength of chemical bonds, and the effective mass and charges of constituent elements. It is sensitive to the local atomic environment of the order of several cations .…”
Section: Introductionmentioning
confidence: 99%