“…So far, the crystal quality and optical properties of AlGaN epilayers and their relationship with growth parameters, such as substrate temperature, precursor flow rates, and dopants employed, have been studied by many researchers using photoluminescence (PL) spectroscopy, atomic force microscopy (AFM), and scanning electron microscopy (SEM). [7][8][9] However, many fundamental issues, such as lattice deformation, local electronic structure, and coordination number (CN) as well as the Ga-N, Ga-Ga, and Ga-Al bond lengths of AlGaN epilayers, especially those with Al contents greater than 50%, remain unknown. [10,11] In this study, the lattice deformation, surface chemical properties, and local electronic structures of AlGaN epilayers with various Al contents are systematically investigated using X-ray diffraction (XRD), Raman, X-ray photoelectron (XPS), and extended X-ray absorption fine structure (EXAFS) spectroscopy.…”