2023
DOI: 10.48550/arxiv.2301.06795
|View full text |Cite
Preprint
|
Sign up to set email alerts
|

Control over epitaxy and the role of the InAs/Al interface in hybrid two-dimensional electron gas systems

Abstract: In-situ synthesised semiconductor/superconductor hybrid structures became an important material platform in condensed matter physics. Their development enabled a plethora of novel quantum transport experiments with focus on Andreev and Majorana physics. The combination of InAs and Al has become the workhorse material and has been successfully implemented in the form of one-dimensional structures and two-dimensional electron gases. In contrast to the well-developed semiconductor parts of the hybrid materials, t… Show more

Help me understand this report

Search citation statements

Order By: Relevance

Paper Sections

Select...
1

Citation Types

0
3
0

Year Published

2023
2023
2023
2023

Publication Types

Select...
1

Relationship

0
1

Authors

Journals

citations
Cited by 1 publication
(3 citation statements)
references
References 19 publications
0
3
0
Order By: Relevance
“…The 8 nm InAs layer hosted a two-dimensional electron gas (2DEG), buried 13.4 nm below the semiconductor surface, as measured by transmission electron microscopy. 51 A 15 nm layer of Al was deposited onto the semiconductor surface, in situ without breaking vacuum in the growth chamber. Measurements of a gated Hall bar in this material showed a peak mobility of 18000 cm 2 V −1 s −1 at an electron sheet density of 8 • 10 11 cm −2 .…”
Section: Methodsmentioning
confidence: 99%
See 2 more Smart Citations
“…The 8 nm InAs layer hosted a two-dimensional electron gas (2DEG), buried 13.4 nm below the semiconductor surface, as measured by transmission electron microscopy. 51 A 15 nm layer of Al was deposited onto the semiconductor surface, in situ without breaking vacuum in the growth chamber. Measurements of a gated Hall bar in this material showed a peak mobility of 18000 cm 2 V −1 s −1 at an electron sheet density of 8 • 10 11 cm −2 .…”
Section: Methodsmentioning
confidence: 99%
“…Figure 1(a) shows a false-colored scanning electron micrograph of Device 1, the principal device under study, which consisted of a planar SQUID fabricated in a heterostructure of InAs (pink) and epitaxial Al (blue). 50,51 The device was covered by a HfO 2 dielectric layer, onto which Au gate electrodes (yellow) were deposited.…”
mentioning
confidence: 99%
See 1 more Smart Citation