2018
DOI: 10.1039/c8ce00387d
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Controllable vapor phase fabrication of F:Mn3O4thin films functionalized with Ag and TiO2

Abstract: The first example of vapor phase fabrication of Mn3O4(hausmannite) thin films chemically modified with fluorine and functionalized with Ag and TiO2, resulting in high purity composites with an intimate constituent contact.

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Cited by 15 publications
(28 citation statements)
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References 68 publications
(141 reference statements)
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“…For both samples, the values of TC220 = 1.3 and TC211 = 0.7 highlighted a preferential (220) orientation, at variance with Si-supported samples [24], suggesting a direct substrate influence on material microstructure and growth mechanism. More specifically, crystallite dimensions (D), dislocation density (δ) and microstrain (ε) values [24] yielded D = 22 (26) nm, δ = 1.5×10 15 (1.0×10 15 ) lines/m 2 and ε = 4.9×10 −3 (4.0×10 −3 ) for Mn3O4/STO (Mn3O4/YAO). As can be observed, both the dislocation density and microstrain values decreased with an increase in the corresponding average crystallite dimensions (and also aggregate sizes estimated by FE-SEM analyses; see below), i.e.…”
Section: Resultsmentioning
confidence: 86%
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“…For both samples, the values of TC220 = 1.3 and TC211 = 0.7 highlighted a preferential (220) orientation, at variance with Si-supported samples [24], suggesting a direct substrate influence on material microstructure and growth mechanism. More specifically, crystallite dimensions (D), dislocation density (δ) and microstrain (ε) values [24] yielded D = 22 (26) nm, δ = 1.5×10 15 (1.0×10 15 ) lines/m 2 and ε = 4.9×10 −3 (4.0×10 −3 ) for Mn3O4/STO (Mn3O4/YAO). As can be observed, both the dislocation density and microstrain values decreased with an increase in the corresponding average crystallite dimensions (and also aggregate sizes estimated by FE-SEM analyses; see below), i.e.…”
Section: Resultsmentioning
confidence: 86%
“…Additional information was obtained by the evaluation of texture coefficients (TC) [24,29] for (211) and (220) reflections. For both samples, the values of TC220 = 1.3 and TC211 = 0.7 highlighted a preferential (220) orientation, at variance with Si-supported samples [24], suggesting a direct substrate influence on material microstructure and growth mechanism.…”
Section: Resultsmentioning
confidence: 99%
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