This investigation aims at studying-by in situ grazing-incidence small-angle x-ray scattering-the process of growth of hexagonal CoSi 2 nanoplatelets endotaxially buried in a Si(001) wafer. The early formation of spherical Co nanoparticles with bimodal size distribution in the deposited silica thin film during a pretreatment at 500 C and their subsequent growth at 700 C were also characterized. Isothermal annealing at 700 C promotes a drastic reduction in the number of the smallest Co nanoparticles and a continuous decrease in their volume fraction in the silica thin film. At the same time, Co atoms diffuse across the SiO 2 /Si(001) interface into the silicon wafer, react with Si, and build up thin hexagonal CoSi 2 nanoplatelets, all of them with their main surfaces parallel to Si{111} crystallographic planes. The observed progressive growths in thickness and lateral size of the hexagonal CoSi 2 nanoplatelets occur at the expense of the dissolution of the small Co nanoparticles that are formed during the pretreatment at 500 C and become unstable at the annealing temperature (700 C). The kinetics of growth of the volume fraction of hexagonal platelets is well described by the classical Avrami equation. V