2015
DOI: 10.1186/s11671-015-0980-6
|View full text |Cite
|
Sign up to set email alerts
|

Controlled growth of Si-based heterostructure nanowires and their structural and electrical properties

Abstract: Ni-catalyzed Si-based heterostructure nanowires grown on crystal Si substrates by hot-wire chemical vapor deposition (HWCVD) were studied. The nanowires which included NiSi nanowires, NiSi/Si core-shell nanowires, and NiSi/SiC core-shell nanowires were grown by varying the filament temperature Tf from 1150 to 1850 °C. At a Tf of 1450 °C, the heterostructure nanowires were formed by crystalline NiSi and crystalline Si that were attributed to the core and shell of the nanowires, respectively. The morphology of t… Show more

Help me understand this report

Search citation statements

Order By: Relevance

Paper Sections

Select...
3

Citation Types

1
2
0

Year Published

2016
2016
2023
2023

Publication Types

Select...
5
1

Relationship

1
5

Authors

Journals

citations
Cited by 8 publications
(3 citation statements)
references
References 34 publications
1
2
0
Order By: Relevance
“…The amorphous structure of the shell nanowire is depicted by the HRTEM image collected at the sidewall as shown in Figure 7 d. The shell nanowire clearly presents that the amorphous structure consisting of nano-crystallites embedded with its amorphous matrix. These nano-crystallites form as elongated crystallites contributing to the columnar structures as observed in the previous reports [ 25 , 35 ]. The estimated lattice spacing is approximately 0.25 nm corresponding to 3C-SiC (111) crystallographic plane (JCPDS card no.…”
Section: Resultssupporting
confidence: 65%
See 2 more Smart Citations
“…The amorphous structure of the shell nanowire is depicted by the HRTEM image collected at the sidewall as shown in Figure 7 d. The shell nanowire clearly presents that the amorphous structure consisting of nano-crystallites embedded with its amorphous matrix. These nano-crystallites form as elongated crystallites contributing to the columnar structures as observed in the previous reports [ 25 , 35 ]. The estimated lattice spacing is approximately 0.25 nm corresponding to 3C-SiC (111) crystallographic plane (JCPDS card no.…”
Section: Resultssupporting
confidence: 65%
“…This can be clearly shown on the formation of bumps along their lengths and the number of bump increases with increase in Ni thickness. The formation of these bumps is generally deduced by the out-diffusion of NiSi core [ 25 ]. These bumps were reported to potentially grow nanowire branches for electrochemical electrode and sensing applications [ 26 ].…”
Section: Resultsmentioning
confidence: 99%
See 1 more Smart Citation