“…Scanning electron microscopy (SEM; S-4700, Hitachi, Tokyo, Japan), together with energy dispersive X-ray spectroscopy (EDX; EDAX Genesis XM2 60, AMETEK, Mahwah, NJ, USA), was employed to characterize the IMC microstructure. For kinetic studies, the IMC thicknesses were measured from the SEM images of the metallographic cross-sections using the following image analysis procedure [7,8]: (1) an SEM image of each sample was obtained at the appropriate magnification; (2) the grayscale SEM image was enhanced using Adobe Photoshop (CS6, Adobe systems, San Jose, CA, USA, 2017) to identify the interfaces between the different layers; and (3) the mean thickness (H IMC ) of individual layers was calculated using the following equation:…”