2016
DOI: 10.18502/kms.v1i1.583
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Controlling Surface Potential of Graphene Using dc Electric Field

Abstract: In this work, we study surface potential of graphite deposited on SiO 2 /Si substrate using Kelvin Probe Force Microscopy (KPFM) and Electric Force Microscopy (EFM). The amplitude modulated KPFM (AM-KPFM) shows that the graphene layer work function is 4.69±0.02 eV, whereas frequency modulated KPFM (FM-KPFM) revealed 4.50±0.02 eV. The work function indifference of 0.19±0.02 eV was attributed to the superior resolution of FM-KPFM and higher detection sensitivity of AM-KPFM. Subsequent EFM mapping suggests that t… Show more

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Cited by 4 publications
(3 citation statements)
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“…KPFM measurement was performed to investigate VCPD which tells the work function difference between the AFM tip and the perovskite local surface. VCPD was measured between the conductive tip of the KPFM and the perovskite film and calculated by the following equation [ 38–40 ] VCPD=normalΦtipnormalΦnormalse…”
Section: Resultsmentioning
confidence: 99%
“…KPFM measurement was performed to investigate VCPD which tells the work function difference between the AFM tip and the perovskite local surface. VCPD was measured between the conductive tip of the KPFM and the perovskite film and calculated by the following equation [ 38–40 ] VCPD=normalΦtipnormalΦnormalse…”
Section: Resultsmentioning
confidence: 99%
“…These results suggest that the lower surface potential with an electronic stable status of the GQD-doped ZnO layer exhibit a higher work function than the pristine ZnO layer. 48 Accordingly, an energy level mismatch occurred, resulting in a slightly low V OC of 0.858 V because the introduction of the GQD-doped ZnO layer rather than the pristine ZnO layer formed relatively large energy barriers. In other words, the enhanced emission intensity occurred mainly owing to energy transfer by introducing the GQD-doped ZnO layer.…”
Section: Table 1 Photovoltaic Performances Of Fabricated Oscs Under 1...mentioning
confidence: 99%
“…Electrostatic force microscopy is a useful technique for investigating the electrical properties of nanomaterials and has been extensively used to study the distribution of electrical potential and charge at the nanoscale for graphene and graphene oxide [92]- [95]. Qualitative mapping of the surface potential is primarily undertaken with EFM.…”
Section: Electrical Properties Efm and 4-point Probe Sheet Resistancementioning
confidence: 99%