2007 14th International Conference on Mixed Design of Integrated Circuits and Systems 2007
DOI: 10.1109/mixdes.2007.4286185
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Convective Cooling Evaluation of Electronic Devices using Lock-in Thermography

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“…The thermal resistance between particular cells of the whole investigated substrate depends on the board thickness t, cells dimensions and thermal conductivity coefficient. Thermal capacitance depends on board dimensions (bulk) and aluminum oxide parameters (specific heat c w and density ρ) [3].…”
Section: Fig2 Chosen Node Of the Thermal Modelmentioning
confidence: 99%
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“…The thermal resistance between particular cells of the whole investigated substrate depends on the board thickness t, cells dimensions and thermal conductivity coefficient. Thermal capacitance depends on board dimensions (bulk) and aluminum oxide parameters (specific heat c w and density ρ) [3].…”
Section: Fig2 Chosen Node Of the Thermal Modelmentioning
confidence: 99%
“…The dependence between convection coefficient and airflow speed was calculated too. For natural and forced convection results of the Spice simulation were obtained [3]. Calculated values of the resistance for particular convection coefficients and their equivalents of airflow speed are shown in table 1.…”
Section: Simulationsmentioning
confidence: 99%