The Transmission Electron Microscope 2012
DOI: 10.5772/36792
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Conventional Transmission Electron Microscope Observation of Electric and Magnetic Fields

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“…Then, the angular distribution of the diffracted electron beams leads to the formation of the image or the diffraction diagram for observation on the screen or on the photographic plate, with an increase in size between 1000 and 300,000 times [23].…”
Section: Transmission Electron Microscopymentioning
confidence: 99%
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“…Then, the angular distribution of the diffracted electron beams leads to the formation of the image or the diffraction diagram for observation on the screen or on the photographic plate, with an increase in size between 1000 and 300,000 times [23].…”
Section: Transmission Electron Microscopymentioning
confidence: 99%
“…This system consists of an emitting electrons source where a set of electromagnetic lenses enclosed in a column evacuated at low pressure [23] control the beam.…”
Section: Transmission Electron Microscopymentioning
confidence: 99%