Coping with re-usability using sequential ATPG: a practical case study

Sas, J. van; Huyskens, E.; Naert, H.; Schell, Frances; Goor, A. van de

doi:10.1109/test.1995.529840

Proceedings of 1995 IEEE International Test Conference (ITC)

DOI: 10.1109/test.1995.529840

|View full text |Cite

Coping with re-usability using sequential ATPG: a practical case study

J. van Sas¹,

E. Huyskens²,

H. Naert³

et al.

Help me understand this report

Search citation statements

Order By: Relevance

Paper Sections

Select...

Citation Types

Supporting

Mentioning

Contrasting

Publication Types

Select...

Other1

Relationship

Self Cite0

Independent1

Authors

Journals

Cited by 1 publication

References 6 publications

Supporting

Mentioning

Contrasting

Order By: Relevance

Towards an effective I/sub DDQ/ test vector selection and application methodology

Sas¹,

Swerts²,

Darquennes³

Proceedings International Test Conference 1996. Test and Design Validity

View full text Add to dashboard Cite

We show that that for a complex CLSI (1.4 A4 transistor; used in the Asymmetric Digital Subscriber Line product range}, 632 IDDQ measurements are needed to obtain 94% pseudo stuck-at fault coverage. The I'DQ test takes less than 200 ms on the VLSI test system, which is between 100 to 300 times faster compared to the use of a PMU. In addition, the OCIMU IDDQ monitor is built into our VLSI test system allowing IDDQ tests at wafer level without placing active components on the load board. This IDDQ methodology applies many IDDQ vectors, achieves a high fault coverage and is feasible in a production environment. Correlation between functional failures and IDDQ failures is around 70 %for three CLSI designs. Extrapolation implies that the slip-through (i.e. bad devices that pass all tests) can be reduced by 70 % by augmenting the test program with an IDDQ test. As a consequence, the non-quality costs can be reduced significantly depending on the slip-through figures, component and repair costs.

show abstract

Towards an effective I/sub DDQ/ test vector selection and application methodology

Sas¹,

Swerts²,

Darquennes³

Proceedings International Test Conference 1996. Test and Design Validity

View full text Add to dashboard Cite

show abstract

scite is a Brooklyn-based organization that helps researchers better discover and understand research articles through Smart Citations–citations that display the context of the citation and describe whether the article provides supporting or contrasting evidence. scite is used by students and researchers from around the world and is funded in part by the National Science Foundation and the National Institute on Drug Abuse of the National Institutes of Health.

Contact Info

customersupport@researchsolutions.com

10624 S. Eastern Ave., Ste. A-614

Henderson, NV 89052, USA

This site is protected by reCAPTCHA and the Google Privacy Policy and Terms of Service apply.

Blog Terms and Conditions API Terms Privacy Policy Contact Cookie Preferences Do Not Sell or Share My Personal Information

Made with 💙 for researchers

Part of the Research Solutions Family.

Coping with re-usability using sequential ATPG: a practical case study

Cited by 1 publication

References 6 publications

Towards an effective I/sub DDQ/ test vector selection and application methodology

Towards an effective I/sub DDQ/ test vector selection and application methodology

Contact Info

Product

Resources

About