2011
DOI: 10.1021/jp2054266
|View full text |Cite
|
Sign up to set email alerts
|

Copper Layers Deposited on Aluminum by Galvanic Displacement

Abstract: Metallization layers nanometers to tens of nanometers thick are desirable for semiconductor interconnects, among other technologically relevant nanostructures. Whereas aqueous deposition of such films is economically attractive, fabrication of continuous layers is particularly challenging on oxidized substrates used in many applications. Here it is demonstrated that galvanic displacement can deposit thin adherent copper layers on aluminum foils and thin films from alkaline copper sulfate baths. According to sc… Show more

Help me understand this report

Search citation statements

Order By: Relevance

Paper Sections

Select...
2
1
1
1

Citation Types

1
26
0

Year Published

2012
2012
2024
2024

Publication Types

Select...
10

Relationship

0
10

Authors

Journals

citations
Cited by 18 publications
(27 citation statements)
references
References 31 publications
1
26
0
Order By: Relevance
“…In some cases, copper layers with equivalent thickness of about 10−20 nm were found, suggestive of particulate deposits observed on planar substrates (see Supporting Information, Figure S1). 8 Here, we focus attention instead on thin film deposits found on some samples. For the conditions of the present experiments (50 mM CuSO 4 concentration, 2 min deposition time, tip radii of curvature between 65 to 180 nm), about 40% of the samples produced thin Cu films.…”
Section: ■ Results and Discussionmentioning
confidence: 99%
“…In some cases, copper layers with equivalent thickness of about 10−20 nm were found, suggestive of particulate deposits observed on planar substrates (see Supporting Information, Figure S1). 8 Here, we focus attention instead on thin film deposits found on some samples. For the conditions of the present experiments (50 mM CuSO 4 concentration, 2 min deposition time, tip radii of curvature between 65 to 180 nm), about 40% of the samples produced thin Cu films.…”
Section: ■ Results and Discussionmentioning
confidence: 99%
“…6,20,26,44 Fig. 3 shows the time transition of OCPs measured for Al sheets immersed in the solutions without and with addition of TU.…”
Section: Resultsmentioning
confidence: 99%
“…Although the galvanic displacement reaction of Cu on Al is possible from aqueous solutions, the presence of an oxide layer on Al inhibits the formation of uniform Cu coatings. Furthermore, strong alkaline solutions or F-containing solutions are required to remove the oxide layer from Al to facilitate the electroless deposition process (Ai et al, 2011; Ye et al, 2012). However, in ionic liquids, no F-containing additive was needed.…”
Section: Electroless Deposition Of Non-noble Metalsmentioning
confidence: 99%