Correct method for calculating energy resolution and instrument functions of scintillation spectrometers

Samedov, Victor V.

doi:10.1007/bf00861996

Cited by 8 publications

(3 citation statements)

References 5 publications

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“…At formulation of a mathematical model describing processes in a scintillation detector, at registration of low‐energy X‐rays, I use the approach developed in the theory of shower spectrometers …”

Section: Mathematical Model Of a Scintillation Detector At Registratimentioning

confidence: 99%

“…At formulation of a mathematical model describing processes in a scintillation detector, at registration of lowenergy X-rays, I use the approach developed in the theory of shower spectrometers. [5][6][7] Let us consider a scintillation X-ray detector with K photodetectors, numbered by index k ¼ 1; K À Á . For simplicity, let physical properties be uniform over the volume of a scintillation crystal.…”

Section: Mathematical Model Of a Scintillation Detector At Registramentioning

confidence: 99%

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How manyFanofactors should characterize anX‐ray scintillation spectrometer?

Samedov

2019

X-Ray Spectrometry

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Bousselham et al. in their article “Photoelectron Anticorrelations and Sub‐Poissonian Statistics in Scintillation Detectors” introduced two Fano factors—the Fano factor for scintillation photons and the Fano factor for photoelectrons. The exact mathematical description of processes at registration of X‐rays by a scintillation detector allows receiving correct formulae for the mean value and the variance of the amplitude at the output of a detector. From the analysis of these formulae, it follows that a scintillation detector should be characterized by only the one Fano factor determining fluctuations in the process of electron‐hole pairs generation. Only this Fano factor is determined by the electronic structure of the scintillation crystal and does not depend on the transparency and coating of the scintillation crystal, and the characteristic of photodetectors, and the crystal‐photodetector interfaces.

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Section: Mathematical Model Of a Scintillation Detector At Registratimentioning

confidence: 99%

Section: Mathematical Model Of a Scintillation Detector At Registramentioning

confidence: 99%

How manyFanofactors should characterize anX‐ray scintillation spectrometer?

Samedov

2019

X-Ray Spectrometry

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“…Our approach to formulation of the mathematical model of an incident particle registration by a scintillation detector is based on the approach developed in formulation of the theory of shower spectrometers in [5], and published in [6] and [7].…”

Section: Introductionmentioning

confidence: 99%

Theoretical Approach to the Energy Resolution of a Scintillation Spectrometer with Several Photodetectors

Samedov

2020

EPJ Web Conf.

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The exact mathematical description of processes at registration of incident particles by a scintillation spectrometer with several photodetectors allows receiving correct formulae for the mean value and the variance of the amplitude at the output of photodetectors, and for the covariance between signals of photodetectors. It was shown that using the relative covariance of signals allows the experimental determination of the covariance in the light yield and the Fano factor in a scintillator. The important advantage of the proposed method is its independence on the gains and the noises of photodetectors electronics.

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Theoretical approach to the energy resolution of semiconductor detectors

Samedov

2016

2016 IEEE Nuclear Science Symposium, Medical Imaging Conference and Room-Temperature Semiconductor Detector Workshop (NSS/MIC/R

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Correct method for calculating energy resolution and instrument functions of scintillation spectrometers

Cited by 8 publications

References 5 publications

How manyFanofactors should characterize anX‐ray scintillation spectrometer?

How manyFanofactors should characterize anX‐ray scintillation spectrometer?

Theoretical Approach to the Energy Resolution of a Scintillation Spectrometer with Several Photodetectors

Theoretical approach to the energy resolution of semiconductor detectors

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