Correction of Secondary Fluorescence Across Phase Boundaries in Electron Probe Microanalysis of Mineral Inclusions

Llovet, Xavier; Proenza, Joaquín A.; Pujol-Solà, Núria; Farré-de-Pablo, Júlia; Campeny, Marc

doi:10.1017/s1431927620024393

Cited by 5 publications

(1 citation statement)

References 57 publications

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“…Therefore, it is essential to select the measurement spots with a sufficient distance from the neighboring mineral 19,48 or utilize simulation software for correcting the secondary fluorescence effect to avoid or reduce secondary fluorescence effect. [53][54][55] For elements with a curved background shape rather than a straight line, such as Al Kα in quartz (Fig. 11a), a two-point exponential curve fitting for the background or a blank correction (measure a zero-concentration standard with a matrix similar to the unknown to obtain an accurate background intensity) is superior to a two-point background interpolation method.…”

Section: Fig 12mentioning

confidence: 99%

Electron Probe Microanalysis In Geosciences: Analytical Procedures And Recent Advances

Yang¹

2022

At.Spectrosc.

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Electron probe microanalysis (EPMA) is an in-situ and non-destructive analytical technique with high spatial resolution and an increasingly important analysis tool in materials science and geosciences. This study summarizes the principles and functions of EPMA, and the problems and difficulties, along with the recent advances in quantitative analysis of EPMA. A routine EPMA procedure includes preparing samples, setting analytical conditions, acquiring data, and evaluating results. Caution is required in all steps to obtain high-quality analytical results. The problems and difficulties commonly encountered in EPMA are discussed and the corresponding measures and solutions required to resolve them are proposed. Specific analytical methods are suggested to make accurate analysis of some specific minerals. We also summarized the challenges and solutions in light element analysis, trace element analysis, EPMA U-Th-Pb total dating, combined analysis with wavelength-and energy-dispersive X-ray spectroscopy, submicron spatial resolution analysis at low accelerating voltages, iron oxidation state analysis, and standard reference materials.

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