2018
DOI: 10.1007/s11106-018-9991-z
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Correctness of Fractal Analysis of Fractographic Surface Microstructure According to Digital SEM Photogrammetry

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Cited by 7 publications
(2 citation statements)
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“…In order to investigate the internal microscopic characterization structure of the substrate culture block material, the substrate culture block was subjected to a scanning electron microscope (Model: Regulus 8100, manufacturer: Hitachi (China) Co., Ltd., Beijing, China), and the transverse section, radial section, and oblique section of the substrate culture block were observed. Comparative observation of the SEM images of the transverse section, radial section, and oblique section of the substrate culture block provides a comprehensive and adequate understanding of its internal microstructure [ 31 ]. The transverse section of the substrate culture block shown in Fig.…”
Section: Methodsmentioning
confidence: 99%
“…In order to investigate the internal microscopic characterization structure of the substrate culture block material, the substrate culture block was subjected to a scanning electron microscope (Model: Regulus 8100, manufacturer: Hitachi (China) Co., Ltd., Beijing, China), and the transverse section, radial section, and oblique section of the substrate culture block were observed. Comparative observation of the SEM images of the transverse section, radial section, and oblique section of the substrate culture block provides a comprehensive and adequate understanding of its internal microstructure [ 31 ]. The transverse section of the substrate culture block shown in Fig.…”
Section: Methodsmentioning
confidence: 99%
“…Common methods for calculating fractal dimension include the box counting method [ 19 ], correlation dimension method [ 20 ], Hurst index method [ 21 ], slit island method [ 22 ], yard stick method [ 23 ], area-perimeter method [ 24 ], Sierpiński carpet method [ 25 ], semi-variance method [ 26 ], and power spectral density [ 27 ] (PSD) method. The main methods to obtain object image are scanning electron microscope [ 28 ] (SEM), transmission electron microscope [ 29 ] (TEM), atomic force microscope [ 30 ] (AFM), and other imaging techniques. When the object is an image, after gray processing, binary processing is carried out [ 31 ].…”
Section: Basic Theory Of Fractalmentioning
confidence: 99%