The stability of well-drained quasistatic foam films (thickness <100 nm) is usually discussed in terms of surface forces, which create an excess pressure normal to the film interfaces, called the disjoining pressure pi The disjoining pressure is the sum of repulsive electrostatic (pi(elec)), attractive van der Waals (pi(vdW)), and repulsive steric (pi(sr)) forces on the assumption that structural forces can be neglected. On the basis of these forces two different types of thin foam films are distinguished, namely common black films (CBF), which are mainly stabilized by pi(elec), and Newton black films (NBF), the stability of which is determined by pi(sr),With a thin-film pressure balance (TFPB) the thickness h of a foam film can be measured as a function of the applied pressure from which the disjoining pressure pi can be calculated. A thorough analysis of the results published so far reveals that the pi-h curves of nonionic surfactants measured at different surfactant concentrations resemble p-V(m) isotherms of a real gas measured at different temperatures. On the basis of these observations the van der Waals description of a real gas can be applied to foam films and a phase diagram for a foam film was constructed using the Maxwell construction.