1996
DOI: 10.1016/0169-4332(95)00304-5
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Correlation between light emission and dangling bonds in porous silicon

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Cited by 14 publications
(6 citation statements)
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“…33,46 However, for PS layers, Mawhinney et al 32 reported that the growth of the absorbance frequencies near 1176 and 1065 cm Ϫ1 is due to the oxidation of the PS surface, and these modes are distinct from Si-O-Si modes at 1134 and 1125 cm Ϫ1 , which originate from oxygen initially present in the bulk of the silicon. They also observed the SiO-H stretch mode by an isotopic method using 16 O and 18 O. This confirms the results of Steckl et al 8 and Yan et al 10 Also in this work the weak band due to SiOH (and H 2 O) was observed at 3400-3500 cm Ϫ1 .…”
Section: Discussionsupporting
confidence: 91%
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“…33,46 However, for PS layers, Mawhinney et al 32 reported that the growth of the absorbance frequencies near 1176 and 1065 cm Ϫ1 is due to the oxidation of the PS surface, and these modes are distinct from Si-O-Si modes at 1134 and 1125 cm Ϫ1 , which originate from oxygen initially present in the bulk of the silicon. They also observed the SiO-H stretch mode by an isotopic method using 16 O and 18 O. This confirms the results of Steckl et al 8 and Yan et al 10 Also in this work the weak band due to SiOH (and H 2 O) was observed at 3400-3500 cm Ϫ1 .…”
Section: Discussionsupporting
confidence: 91%
“…Shih et al 15 indicated that the PL increases in an anodically oxidized PS layer with increasing laser illumination time while the PS is oxidized without hydrogen loss, and the dangling bond density decreases in the PLenhanced samples. Many authors [16][17][18] have reported that the Si dangling bond is an important factor in PS luminescence. However, in contrast, Prokes and Carlos 19 found a direct correlation between the nonbridging oxygen-hole center clusters (seen as a Si vacancy) and the red PL intensity.…”
mentioning
confidence: 99%
“…Nanometer-sized particles, especially silicon, raise much interest in applications not only to electronic devices but also to optoelectronic devices. In fact, photoluminescence spectra for silicon nanoparticles have been widely studied to apply nanosized silicon to optoelectronic devices. Silicon clusters composed of almost all surface atoms become relatively stable because they have corresponding compact structures with less number of dangling bonds . For example, silicon nanoparticles reveal lower oxidation reaction rates as their diameters decrease .…”
Section: Introductionmentioning
confidence: 99%
“…Indeed, a strong EPR response from Si NPs (curve 1) caused by a large amount (0.51 × 10 19 spin g −1 ) of paramagnetic states with unpaired electrons can be seen in Figure c. Data analysis gives a g‐factor value 2.0055 ± 0.0005 that can indicate the presence of dangling bonds of disordered silicon . Based on studied optoelectronic properties, one can imagine a core‐shell structure of Si NPs prepared by laser decomposition where defective amorphous silicon core is covered with optically active crystalline Si/SiO x shell.…”
Section: Resultsmentioning
confidence: 99%
“…Being nonequilibrium process, laser decomposition could provoke an efficient interaction between silicon and oxygen forming Si‐O bonds and resulting to oxidation of silicon NPs. Their surface chemistry is studied by Fourier‐transform infrared spectroscopy (FTIR) indicating some characteristic features in the spectrum, in particular, signals at 911 cm −1 (Si‐H 2 ), 1055 cm −1 (Si‐O‐Si), and 2115 cm −1 (Si‐H x ) that could point out some types of defect states in Si NPs studied by EPR spectroscopy. Indeed, a strong EPR response from Si NPs (curve 1) caused by a large amount (0.51 × 10 19 spin g −1 ) of paramagnetic states with unpaired electrons can be seen in Figure c.…”
Section: Resultsmentioning
confidence: 99%