Correlation between structural and morphological properties of multilayer perovskite ZnTiO₃coated porous silicon

Abstract

This work reports on correlation between structural and morphological properties of ZnTiO3/ porous silicon (PS). The PS were elaborated by electrochemical anodization from the single-crystal p-type silicon wafer. Nanocrystalline ZnTiO3 thin films have been prepared on PS using sol-gel spin coating technique. The deposited films were annealed in air at 800 °C for two hours. The structural, and morphological properties of the films were studied for different number of layers. X-ray diffraction spectra confirms that ZnTiO3 films were hexagonal phase and the crystallite size of ZnTiO3 films increased from 120.56 nm to 125.45nm when the number of layers increase from 4 to 8 layers. SEM image shows approximate semi-spherical particles with a little agglomeration for all samples. The morphologies changed and the average grain size changed and increase from 81nm to 131nm.