2005
DOI: 10.1021/nl047929s
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Correlation between Surface Photovoltage and Blend Morphology in Polyfluorene-Based Photodiodes

Abstract: We present a microscopic study of photoinduced charge generation in polyfluorene-based photovoltaic structures. The sub-100 nm lateral resolution of scanning Kelvin probe microscopy allows characterizing the three-dimensional structure of thin films of blends of poly-(9,9'-dioctylfluorene-co-benzothiadiazole) (F8BT) and poly-(9,9'-dioctylfluorene-co-bis-N,N'-(4-butylphenyl)-bis-N,N'-phenyl-1,4-phenylenediamine) (PFB). From the strong correlation between surface photovoltage and blend morphology, we propose a s… Show more

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Cited by 161 publications
(173 citation statements)
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“…[ 14 ] Similar surface-stratifi cation has been seen in other conjugated polymer-based blend systems and has been argued to improve/reduce the injection/ extraction of electrons and holes in organic light-emitting diodes (OLEDs) and OPVs depending on the location of the blend components. [15][16][17] On thermal annealing at 70 ° C, we fi nd that the negative d 5 -PC 60 BM concentration gradient increases slightly, suggesting that thermal annealing further encourages the migration of PCBM towards the fi lm surface. Such a migration process is again consistent with our previous observations.…”
mentioning
confidence: 94%
“…[ 14 ] Similar surface-stratifi cation has been seen in other conjugated polymer-based blend systems and has been argued to improve/reduce the injection/ extraction of electrons and holes in organic light-emitting diodes (OLEDs) and OPVs depending on the location of the blend components. [15][16][17] On thermal annealing at 70 ° C, we fi nd that the negative d 5 -PC 60 BM concentration gradient increases slightly, suggesting that thermal annealing further encourages the migration of PCBM towards the fi lm surface. Such a migration process is again consistent with our previous observations.…”
mentioning
confidence: 94%
“…For example, conductive AFM (C-AFM) measures locally the electrical properties of the polymer blend, 41 where as Kelvin probe AFM measures locally the surface potential of the sample. [42][43][44] Since these scanning probe techniques exploit the electron donating or accepting properties of the photovoltaic blend, they obtain better contrast. The lateral resolution of these measurements techniques may be better than 100 nm.…”
Section: Toolbox To Probe the Morphologymentioning
confidence: 99%
“…5 However, while these techniques broadly control the domain size, crystallinity, or packing of the components of the BHJ, these characteristics of the blend morphology are not uniform throughout the film. Indeed, studies of the structure of polymer-polymer, 3,6,7 polymer-fullerene, [8][9][10] and polymernanocrystal 11 blends show hierarchies of phase separation and vertical variations in the blend morphology. How this local variation in blend morphology affects the local mobility of carriers, and in particular the PV performance, is largely unknown.…”
Section: Introductionmentioning
confidence: 99%