Correlation of the V/sub T/ drift in a-Si:H TFT to the optically observed flicker increase in AMLCD

Huang, Chung-Che; Constable, J.H.; Yost, Beth; Greene, Raymond G.

doi:10.1109/relphy.2003.1197776

2003 IEEE International Reliability Physics Symposium Proceedings, 2003. 41st Annual.

DOI: 10.1109/relphy.2003.1197776

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Correlation of the V/sub T/ drift in a-Si:H TFT to the optically observed flicker increase in AMLCD

Chung-Che Huang

J.H. Constable

Beth Yost³

et al.

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Correlation of the V/sub T/ drift in a-Si:H TFT to the optically observed flicker increase in AMLCD

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References 7 publications

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