2020
DOI: 10.3390/met10080986
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Corrosion Behavior and Morphology of Passive Films Modified with Zinc–Aluminum Simultaneous Treatment on Different Metals

Abstract: Passive films were formed on A508-3 steel (A508-3), 304L stainless steel (304L) and Incoloy 800 (In800) with blank/zinc/zinc–aluminum treatments in air at 300 °C. The electrochemical corrosion behaviors of different metals were investigated through potentiodynamic polarization, electrochemical impedance spectroscopy and the Mott–Schottky technique. The morphology and composition of passive films were analyzed using scanning electron microscopy (SEM) and energy dispersive spectrometry (EDS). The zinc–aluminum t… Show more

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Cited by 4 publications
(2 citation statements)
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“…The analysis results of the M-S curve can obtain electronic distribution information such as the semiconductor characteristics of the passivation film and the carrier concentration distribution, which is of great significance for understanding the performance and formation mechanism of the passivation film. When the external potential causes the carrier concentration in the space charge layer of the passivation film to be in a depleted state, the relationship between the space charge layer capacitance Csc and the external potential E satisfies the M-S curve relationship [15,16]. By calculating the slope of the M-S curve, different types of semiconductors can be corresponded, with a positive slope for N-type semiconductors and a negative slope for P-type semiconductors.…”
Section: Resultsmentioning
confidence: 99%
“…The analysis results of the M-S curve can obtain electronic distribution information such as the semiconductor characteristics of the passivation film and the carrier concentration distribution, which is of great significance for understanding the performance and formation mechanism of the passivation film. When the external potential causes the carrier concentration in the space charge layer of the passivation film to be in a depleted state, the relationship between the space charge layer capacitance Csc and the external potential E satisfies the M-S curve relationship [15,16]. By calculating the slope of the M-S curve, different types of semiconductors can be corresponded, with a positive slope for N-type semiconductors and a negative slope for P-type semiconductors.…”
Section: Resultsmentioning
confidence: 99%
“…Similar findings were observed by other authors when studying stainless steel samples. 44,70,71 Composition of the oxide layer by ARXPS.-In order to confirm the hypothesis of the duplex native oxide layer, ARXPS measurements were run by modifying the take-off angle, avoiding any possible side effects or perturbation of the surface during the Ar ion sputtering in the depth profile experiments (e.g., inhomogeneous sputtering of the surface). Information of such oxide layers was obtained at different depths (the higher angle, the deeper analysed spot) using as obtained samples (without any previous sputtering).…”
Section: Resultsmentioning
confidence: 99%