Cost and Effective Way to Reduce Radiation Damage and Enhance Image Contrast of Beam Sensitive Materials in TEM

Lin, Ching-Chun; Hsu, Kim

doi:10.1109/ipfa.2018.8452568

2018 IEEE International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA) 2018

DOI: 10.1109/ipfa.2018.8452568

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Cost and Effective Way to Reduce Radiation Damage and Enhance Image Contrast of Beam Sensitive Materials in TEM

Ching-Chun Lin

Kim Hsu

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Cost and Effective Way to Reduce Radiation Damage and Enhance Image Contrast of Beam Sensitive Materials in TEM

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References 8 publications

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