Abstract:A cost-effective method for the quantitative characterization of the magnetostrictive effect in thin films is presented. In this method, a sample's magnetostriction is extrapolated from the tip displacement of a thin-film magnetostrictive cantilever. The tip displacement is measured by monitoring the position of a reflected laser beam using two differentially coupled photodiode positioning sensors. In contrast with alternative optical deflection-angle devices designed for educational purposes, the detection li… Show more
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