2017
DOI: 10.1088/1367-2630/aa59ad
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Coulomb interaction-induced jitter amplification in RF-compressed high-brightness electron source ultrafast electron diffraction

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Cited by 5 publications
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“…The second scheme is to leave the space-charge broadening initially, and then compress the bunch duration all the way to sub-ps range right at its arrival at sample's location. [32][33][34] In this case, 10 5 to 10 6 electrons per pulse are achieved with subps longitudinal duration, or very few electrons are bunched for even shorter duration (fs scale). [35] In this paper, we will focus on the second scheme, which is applied for the UED station in SECUF.…”
Section: Advantage and Disadvantage In Using Electronsmentioning
confidence: 99%
“…The second scheme is to leave the space-charge broadening initially, and then compress the bunch duration all the way to sub-ps range right at its arrival at sample's location. [32][33][34] In this case, 10 5 to 10 6 electrons per pulse are achieved with subps longitudinal duration, or very few electrons are bunched for even shorter duration (fs scale). [35] In this paper, we will focus on the second scheme, which is applied for the UED station in SECUF.…”
Section: Advantage and Disadvantage In Using Electronsmentioning
confidence: 99%