Counterfeit Chip Detection using Scattering Parameter Analysis

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Counterfeit Chip Detection using Scattering Parameter Analysis

Cited by 4 publications

References 11 publications

Experimental Evaluation for Detecting Aging Effect on Microcontrollers based on Side-Channel Analysis

Experimental Evaluation for Detecting Aging Effect on Microcontrollers based on Side-Channel Analysis

Fundamental Study on Detection of Counterfeit Parts with Abnormal Aging Characteristics Using Electromagnetic Backscattering from I/O Circuits

Parasitic Circus: On the Feasibility of Golden-Free PCB Verification

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