Coupled Parametric Effects on Magnetic Fields of Eddy-Current Induced in Non-Ferrous Metal Plate for Simultaneous Estimation of Geometrical Parameters and Electrical Conductivity

Lee, Kok-Meng; Lin, Chun-Yeon; Hao, Bingjie; Li, Min

doi:10.1109/tmag.2017.2715831

Cited by 9 publications

(2 citation statements)

References 19 publications

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“…The reaction field depends on the characteristics of the tested material [7]. ECT techniques can be used to measure a specimen's electromagnetic properties (electrical conductivity and magnetic permeability, if any) [20], [21], to detect superficial or subsuperficial defects [22]- [24], and to measure the thickness of metallic plates [8]- [18].…”

Section: Theoretical Framework Of Thickness Estimation Using Eddy Cur...mentioning

confidence: 99%

“…Thus, despite the availability of several highly accurate measuring instruments based on the aforementioned technologies, the search for new, accurate, fast, cheap, distributed, online and real-time measurement methods, technologies and instruments remains an open issue that is being addressed by numerous researchers around the world [5], [6]. In this framework, several research groups are investigating the possibility offered by Eddy Current Testing (ECT) techniques [7], which typically assure low costs, simple probes and ease of realization for on-line, real-time and distributed measurement systems.…”

Section: Introductionmentioning

confidence: 99%

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An Eddy-Current Testing Method for Measuring the Thickness of Metallic Plates

Sardellitti

Milano

Laracca

et al. 2023

IEEE Trans. Instrum. Meas.

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Thickness measurements of metallic plates are mandatory in many industrial scenarios. Methods based on Eddy Current Testing (ECT) are ideal for fast and accurate online contact-less thickness measurements, making them very attractive in the Industry 4.0 scenario. This contribution is focused on a specific and robust ECT technique proposed in the past by the scientific community. The main limitation is its applicability to thin materials only, where the thickness of the material is much smaller than the overall size of the ECT probe. Extending the range of applicability to thicker materials, introduces a progressive and severe degradation of the measurement accuracy.In this paper, we analyse the theoretical foundation of this method with an entirely original approach based on the celebrated Buckingham's π theorem. In doing this, we draw the complete theoretical picture of the method, providing a simple, clear and rigorous view of its performance and intrinsic limitations. Moreover, we propose two solutions, one analytical and the other iterative, to accurately estimate the thickness of materials from thin to thick values. Finally, a numerical analysis combined with an experimental campaign confirms the effectiveness of the proposed solutions making the method suitable for industrial and other applications.

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