Abstract:The temperature dependences of acceptor concentration n A , conductivity mobility C , and resistivity of gallium (Ga)-doped Czochralski (CZ)-silicon (Si) crystals were studied in the temperature range from 220 to 360 K (À53 to 87 C). Crystals with Ga concentration N A from 6:1 Â 10 14 to 2:0 Â 10 18 atoms/cm 3 were analyzed by Hall-effect measurements using the van der Pauw method in the temperature range from 80 to 360 K. The temperature dependences of n A and of crystals with less than 10 16 atoms/cm 3 showe… Show more
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