2018
DOI: 10.1007/978-3-319-75895-4_17
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Coupling Spectroscopic Ellipsometry and Quartz Crystal Microbalance to Study Organic Films at the Solid–Liquid Interface

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Cited by 9 publications
(8 citation statements)
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“…SE measures the change of the ellipsometric angles Ψ and Δ of polarized light upon changes in the refractive index and thicknesses of optical layers . We measured the SiO 2 layer in buffer and fitted its thickness and the angle of incidence offset based on the known optical properties of thermal SiO 2 with the J.A.…”
Section: Methodsmentioning
confidence: 99%
“…SE measures the change of the ellipsometric angles Ψ and Δ of polarized light upon changes in the refractive index and thicknesses of optical layers . We measured the SiO 2 layer in buffer and fitted its thickness and the angle of incidence offset based on the known optical properties of thermal SiO 2 with the J.A.…”
Section: Methodsmentioning
confidence: 99%
“…The thickness changes observed in Figure with half-cycle resolution may be understood as convoluted effects on the geometrical thickness or refractive index of the SiO 2 film or its surface . Alkyl groups are highly polarizable as known by their high Raman cross sections. , Consequently, ellipsometry can sensitively detect their adsorption or removal.…”
Section: Resultsmentioning
confidence: 99%
“…Nonetheless, some density refinements considering separately the coating and media densities can be further explored, if needed. [ 29 ] Besides, the most relevant refined density expression is discussed in the ESI. Step 4 is designed as an iterative loop for validating and refining the models used.…”
Section: Resultsmentioning
confidence: 99%
“…Therefore, performing simultaneous QCM‐D/SE measurements can provide useful insights of the solid‐liquid interface. [ 29 ]…”
Section: Resultsmentioning
confidence: 99%