1987
DOI: 10.1103/physrevb.36.1238
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Covalent insulatorCeO2: Optical reflectivity measurements

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Cited by 284 publications
(134 citation statements)
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“…Overall, these calculations give lattice parameters within 1% of the experimental values, slightly improving over the DFT(+U) results. The calculated electronic structures, i.e., the band dispersions and the position of the empty Ce 4f and Ce 5d bands with respect to the occupied O 2p bands are also in good agreement with experimental data [19][20][21][22][23].…”
Section: Introductionsupporting
confidence: 71%
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“…Overall, these calculations give lattice parameters within 1% of the experimental values, slightly improving over the DFT(+U) results. The calculated electronic structures, i.e., the band dispersions and the position of the empty Ce 4f and Ce 5d bands with respect to the occupied O 2p bands are also in good agreement with experimental data [19][20][21][22][23].…”
Section: Introductionsupporting
confidence: 71%
“…The electronic structure of CeO 2 has been probed by different experimental techniques, including valence x-ray photoemission spectroscopy (XPS) [19][20][21][22], O 1s x-ray absorption spectroscopy (XAS) [20], electron energy loss spectroscopy (EELS) [20,21], and optical reflectance (OR) [23]. The valence band, composed of O 2p states is separated by a gap of ~3 eV from a quite narrow unoccupied band composed of Ce 4f states.…”
Section: Introductionmentioning
confidence: 99%
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“…The resulting fits are shown in red in the plots in Figure 3 ("dispersion fit"), and the corresponding parameter values are provided in Table II. The dispersion behavior implied for undoped and 20% Sm doped ceria is summarized in Figure 4, where Fig. 4(a) compares the present results for undoped ceria with literature values, [14][15][16][17][18][19] and Fig. 4(b) compares the three films studied here to one another.…”
Section: Optical Propertiesmentioning
confidence: 90%
“…The parameters obtained from the fitting are in good agreement with the independently measured values, providing a validation of the procedures. [14][15][16][17][18][19] (b) substrate and dopant effects. Deposition on MgO(100) (Film #3) leads to a slight decrease in n relative to deposition on YSZ(100) (Film #1), likely due to poorer crystallographic registry between film and substrate creating a slightly lower density.…”
Section: Microstructural Properties a Model Validation Using Densmentioning
confidence: 99%