2018
DOI: 10.1002/jrs.5453
|View full text |Cite
|
Sign up to set email alerts
|

Cover Image

Abstract: The back cover image, by Sebastian Schipporeit et al., is based on the Research Article Spectral decomposition of Raman spectra of mixed‐phase TiO2 thin films on Si and silicate substrates, https://doi.org/10.1002/jrs.5369.

Help me understand this report

Search citation statements

Order By: Relevance

Paper Sections

Select...
1
1

Citation Types

0
2
0

Year Published

2019
2019
2021
2021

Publication Types

Select...
2

Relationship

0
2

Authors

Journals

citations
Cited by 2 publications
(2 citation statements)
references
References 0 publications
0
2
0
Order By: Relevance
“…The peaks at 300, 520, and 960 cm −1 are associated with the vibration bands of polycrystalline Si. [38] All the specimens exhibit a carbon D-band signal at ≈1345 cm −1 and a carbon G-band signal at ≈1595 cm −1 . [39] The former is related to imperfect carbon bonding and the latter results from the Raman-allowed in-plane vibration of sp 2 carbon.…”
Section: Resultsmentioning
confidence: 91%
“…The peaks at 300, 520, and 960 cm −1 are associated with the vibration bands of polycrystalline Si. [38] All the specimens exhibit a carbon D-band signal at ≈1345 cm −1 and a carbon G-band signal at ≈1595 cm −1 . [39] The former is related to imperfect carbon bonding and the latter results from the Raman-allowed in-plane vibration of sp 2 carbon.…”
Section: Resultsmentioning
confidence: 91%
“…Kumar et al used Raman scattering to study the influence of substrate on molecular order for self‐assembled adlayers of CoPc and FePc (metal phthalocyanine) thin films of about 50 nm thickness on technolically relevant substrates such as SiOx/Si, indium tin oxide, and polycrystalline gold . Schipporeit and Mergel studied the spectral decomposition of Raman spectra of mixed‐phase TiO 2 thin films on Si and silicate substrates …”
Section: Solid‐state Studiesmentioning
confidence: 99%