“…After vacuum annealing at about 1030 K, no C and O are left on the surface as measured by X-ray photoelectron spectroscopy (XPS). Carbon is deposited on Si(0 0 1) at room temperature by hot-wire chemical vapor deposition (HW-CVD) [10] using a heated (B2300 K) tungsten filament to dissociate ethylene at a typical pressure of 2.5 Â 10 À3 Torr. Prior to Si deposition, the C/ Si(0 0 1) samples were annealed at 975 K for 20 min.…”