Interface Controlled Materials 2000
DOI: 10.1002/352760622x.ch6
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Creation and Properties of Thin‐Film Multilayer Structures Nb/Al 2 O 3 ‐Al/Nb for Josephson Junctions

T.S. Lebedeva
1
,
Pavel Shpilevoy
2
,
Igor Voytovytch
3
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