2009
DOI: 10.1016/j.msea.2008.08.045
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Creep-damage assessment of high chromium heat resistant steels and weldments

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Cited by 42 publications
(11 citation statements)
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“…The average KAM and area-weighted average GOS values calculated from each location of EXL and EXH specimens are shown in Figure 12a,b, respectively. As Fujiyama et al [42] found that the mean KAM values decrease with increased creep exposure and correlate with a decrease in dislocation density and subsequently hardness, it can be concluded from Figure 12 that EXH demonstrates higher damage accumulation possibly due to competing processes of migration of micro-grain boundaries during grain growth and an increase in frequency of subgrain boundaries, which is also manifested as a reduction in hardness, as shown in Figure 6.…”
Section: Resultsmentioning
confidence: 77%
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“…The average KAM and area-weighted average GOS values calculated from each location of EXL and EXH specimens are shown in Figure 12a,b, respectively. As Fujiyama et al [42] found that the mean KAM values decrease with increased creep exposure and correlate with a decrease in dislocation density and subsequently hardness, it can be concluded from Figure 12 that EXH demonstrates higher damage accumulation possibly due to competing processes of migration of micro-grain boundaries during grain growth and an increase in frequency of subgrain boundaries, which is also manifested as a reduction in hardness, as shown in Figure 6.…”
Section: Resultsmentioning
confidence: 77%
“…TKD maps were used to investigate another means of assessing creep damage, as proposed by Fujiyama et al [42], for high Cr steels involving the analysis of Kernel Average Misorientation (KAM), which is the accumulated misorientation angle measured over a kernel of pixels surrounding each measurement point.…”
Section: Resultsmentioning
confidence: 99%
“…One method for analyzing strain stored energy is to consider kernel average misorientation (KAM) map obtained by processing EBSD data. KAM is defined as the average misorientation angle between a measurement point and all its neighbors at a certain distance, excluding misorientation angles above 5° . Figure shows image quality (IQ) map of the microstructure as well as its KAM map.…”
Section: Resultsmentioning
confidence: 99%
“…KAM value for each pixel is defined as the average misorientation that a pixel has with its neighbors (6 in our case), while boundaries with orientation difference over 5°are recognized as grain boundaries. KAM value is an appropriate quantity used to evaluate the strain or the stored energy at a given point (Ref 13,14).…”
Section: Methodsmentioning
confidence: 99%