2001
DOI: 10.1109/23.983158
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Critical charge for single-event transients (SETs) in bipolar linear circuits

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Cited by 45 publications
(22 citation statements)
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“…2 a diagram of the input circuit. A more detailed discussion of the circuit is contained in last year's publication [4]. For the microbeam measurements, for each test condition (∆V in = ±10 mV), only one transistor on the die exhibits sensitivity to SETs.…”
Section: Resultsmentioning
confidence: 99%
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“…2 a diagram of the input circuit. A more detailed discussion of the circuit is contained in last year's publication [4]. For the microbeam measurements, for each test condition (∆V in = ±10 mV), only one transistor on the die exhibits sensitivity to SETs.…”
Section: Resultsmentioning
confidence: 99%
“…The bias conditions during irradiation for the LM111 and LM124 are given in a previous publication [4] and were as follows: 1) for the LM111 Vcc = ±5V, the output load was 1.5 kΩ and the differential input voltage was ±10 mV and 2) for the LM124 Vcc = ±6V, with an inverted gain of 20 and an input voltage of -60 mV, giving an output voltage of +1.2V.…”
Section: Experimental Descriptionmentioning
confidence: 99%
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“…When radiation using photons, interacts with a material, it generates an electron with significantly high energy, which can penetrate deep into any material substrate and cause damage to various electronics. This issue is a very important issue that affects the performance of all circuits in the presence of radiation and for this reason, there have been significant amount of research to investigate this issue [7][8][9][10][11]. The interaction of this high-energy electron with a single device causes a sharp increase in voltage/current, which can burn out devices or cause inaccurate reading, which has to be avoided at all costs.…”
Section: Circuit Topologymentioning
confidence: 99%
“…A lot of factors affect the shape of these transients: The kind and energy of the ion, the sort of technology, the feedback network, the input values, etc [2][3][4][5][6][7][8][9][10][11]. Load effects have been studied in several structures although attention is usually paid on capacitive loads putting aside other kinds such as load or pull-up resistors.…”
Section: Introductionmentioning
confidence: 99%