2003
DOI: 10.1088/0953-2048/16/9/309
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Critical current degradation behaviour in Bi-2223 superconducting tapes under bending and torsion strains

Abstract: In this paper, we have investigated the Ic degradation behaviours in Ag alloy sheathed Bi-2223 superconducting tapes under bending and torsion strains. In particular, we have examined the homogeneity of Ic degradation along the longitudinal direction of tapes by adopting multiple voltage terminals. The bending modes influenced the Ic degradation behaviour in Bi-2223 tapes. A gradual and consistent decrease of Ic could be observed at all sections, which was a different behaviour from that under tensile loading.… Show more

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Cited by 75 publications
(62 citation statements)
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“…2. This rig is suitable for the test of thin CC tapes in the easy bending mode [13]. The tape was mechanically connected to the current terminal blocks instead of soldering.…”
Section: Methodsmentioning
confidence: 99%
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“…2. This rig is suitable for the test of thin CC tapes in the easy bending mode [13]. The tape was mechanically connected to the current terminal blocks instead of soldering.…”
Section: Methodsmentioning
confidence: 99%
“…However, in applications to electrical devices such as power cables, motors and magnets, HTS tapes are subjected to various kinds of stresses and strains [5][6][7][8][9][10][11][12][13][14][15]. The investigation of I cstrain/stress behaviors of ReBCO CC tapes will be of great significance in the design of superconducting devices.…”
Section: Introductionmentioning
confidence: 99%
See 1 more Smart Citation
“…The effect of torsion on the critical current (I c ) of HTS conductors has been studied and reported by some authors [4]- [6]. In this paper, using an accurate description of the I c dependence on axial strain, a self-consistent analytical expression of the I c dependence on twist pitch is elaborated for both YBCO and BSCCO conductors.…”
Section: Introductionmentioning
confidence: 99%
“…[1][2][3][4][5][6][7][8][9][10][11][12][13][14] Heterogeneous damage occurs, and the damage evolution behavior differs from specimen to specimen and from location to location within a specimen. [9][10][11][12][13][14] Accordingly, when a number of specimens are tested, the critical current differs from specimen to specimen.…”
Section: Introductionmentioning
confidence: 99%