2013
DOI: 10.1063/1.4818957
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Critical size for the generation of misfit dislocations and their effects on electronic properties in GaAs nanosheets on Si substrate

Abstract: While nanowires and nanosheets (NSs) grown on lattice-mismatched substrates have a number of promising technological applications such as solar cells, generation of misfit dislocations (MFDs) at their interfaces is a major concern for the efficiency of these devices. Here, combined moleculardynamics and quantum-mechanical simulations are used to study MFDs at the interface between a GaAs NS and a Si substrate. Simulation results show the existence of a critical NS thickness, below which NSs are grown free of M… Show more

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Cited by 3 publications
(4 citation statements)
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References 52 publications
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“…Our measured period also agrees with the value calculated by Yuan et al . combining molecular-dynamics and quantum-mechanics simulations …”
Section: Resultsmentioning
confidence: 99%
See 2 more Smart Citations
“…Our measured period also agrees with the value calculated by Yuan et al . combining molecular-dynamics and quantum-mechanics simulations …”
Section: Resultsmentioning
confidence: 99%
“…Previous calculations based on continuum elasticity have estimated the critical height and diameter of nanowires for MFD generation and shown considerable stress relief through MFDs. 48,101 The nanowires discussed in this paper fall into this category. As shown in Figure 1d, the distance between two adjacent As atoms in the [11−2] direction is 3.47 Å, and the lattice mismatch is 4.1%, so the period of MFD is 3.47 Å/0.041 = 8.46 nm.…”
Section: Resultsmentioning
confidence: 99%
See 1 more Smart Citation
“…I, TSLs in [111]-oriented III-V semiconductor NWs are commonly associated with {111} sidewall facets. [6][7][8] To simplify the geometry while retaining this key feature, we here simulate a GaAs nanosheet (NS) 39,40 as shown in Fig. 1(b).…”
Section: System Setupmentioning
confidence: 99%