2020
DOI: 10.1007/s11668-020-01047-w
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Critical Ultimate Load and Ultimate Bearing Failure of CT110 with Initial Crack Defect

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“…However, MEMD adds a masking signal to the signal processing, and the selection and the processing of the masking signal are uncertain. In the signal processing process, the added signal cannot be fully integrated, which leads to the performance defects of MEMD [3].…”
Section: Introductionmentioning
confidence: 99%
“…However, MEMD adds a masking signal to the signal processing, and the selection and the processing of the masking signal are uncertain. In the signal processing process, the added signal cannot be fully integrated, which leads to the performance defects of MEMD [3].…”
Section: Introductionmentioning
confidence: 99%