2020 36th Semiconductor Thermal Measurement, Modeling &Amp; Management Symposium (SEMI-THERM) 2020
DOI: 10.23919/semi-therm50369.2020.9142843
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Cross Correlation Method for Images Alignment: Application to 4 Buckets Calculation in Thermoreflectance

Metayrek Youssef1,
T. Kociniewski2,
Zoubir Khatir3
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