2022
DOI: 10.36227/techrxiv.21230789.v1
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Cross-Layer Reliability Modeling of Dual-Port FeFET: Device-Algorithm Interaction

Abstract: <p>Today's data-centric applications are incompatible with the predominant compute-centric computer architectures. The small on-chip memories of compute-centric computer architecture demand many energy-costly data transfers exposing the von-Neumann bottleneck. The Ferroelectric Field-Effect Transistor (FeFET) is an emerging Non-Volatile Memory technology enabling novel data-centric architectures that go far beyond von-Nuemann principles. FeFETs are very promising for a wide range of applications starting… Show more

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