2023
DOI: 10.1016/j.jcrysgro.2023.127114
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Crying Wulff on vapor–solid distributions of crystallogen chemical vapor deposition via p-block element hydride thermal decomposition

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Cited by 2 publications
(12 citation statements)
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“…GR(hkl) aligns well with surface energy ratio when experiments are properly conducted,. 17 Destefanis has noticed a near identity between GR(110)/GR(100) = 0.74 and the corresponding dangling bond ratio of 0.71,. 150 Hartmann has compared epitactic Ge(hkl) GR between 400 °C and 700 °C, Table I,.…”
Section: Resultsmentioning
confidence: 97%
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“…GR(hkl) aligns well with surface energy ratio when experiments are properly conducted,. 17 Destefanis has noticed a near identity between GR(110)/GR(100) = 0.74 and the corresponding dangling bond ratio of 0.71,. 150 Hartmann has compared epitactic Ge(hkl) GR between 400 °C and 700 °C, Table I,.…”
Section: Resultsmentioning
confidence: 97%
“…Across crystallogen, there is also scattered evidence for other fractional values such as ⅓ and ⅕, when growth is carried out via an oligomeric precursor,. 17 The Arrhenius plot for silicon deposition via silane shows two typical sections, Fig. 4.…”
Section: Resultsmentioning
confidence: 99%
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