2022
DOI: 10.1101/2022.09.21.508877
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Cryo-plasma FIB/SEM volume imaging of biological specimens

Abstract: Serial focussed ion beam scanning electron microscopy (FIB/SEM) enables imaging and assessment of sub-cellular structures on the mesoscale (10 nm to 10 μm). When applied to vitrified samples, serial FIB/SEM is also a means to target specific structures in cells and tissues while maintaining constituents' hydration shells for in-situ structural biology downstream. However, the application of serial FIB/SEM imaging of non-stained cryogenic biological samples is limited due to low contrast, curtaining and chargi… Show more

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Cited by 4 publications
(16 citation statements)
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“…Charging artefacts often appear when insulating materials interact with the electron beam (2,4) . This effect is normally minimized by adjusting beam energy or scanning parameters, and its severity depends on the target substance being imaged.…”
Section: Charge Artifact Mitigationmentioning
confidence: 99%
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“…Charging artefacts often appear when insulating materials interact with the electron beam (2,4) . This effect is normally minimized by adjusting beam energy or scanning parameters, and its severity depends on the target substance being imaged.…”
Section: Charge Artifact Mitigationmentioning
confidence: 99%
“…In our recent cryogenic pFIB/SEM study (2) , calibration was performed using images of polystyrene beads of 1 m diameter (Abvigen, USA). The images show the same field-of-view at 1.12, 2.25, and 4.5 nm pixel size.…”
Section: Calibrationmentioning
confidence: 99%
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