2024
DOI: 10.1042/bst20231553
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CryoEM grid preparation: a closer look at advancements and impact of preparation mode and new approaches

Isobel J. Hirst,
William J.R. Thomas,
Rhiannon A. Davies
et al.

Abstract: Sample preparation can present a significant hurdle within single particle cryo-electron microscopy (cryoEM), resulting in issues with reproducibility, data quality or an inability to visualise the sample. There are several factors which can influence this, including sample or buffer composition, grid type, route of sample preparation and interactions with the air–water interface (AWI). Here, we review some of the current routes for sample preparation and the associated challenges. We discuss a range of approa… Show more

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