1998
DOI: 10.1002/(sici)1521-4095(199803)10:5<379::aid-adma379>3.0.co;2-a
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Crystal Growth, Structure, and Electronic Band Structure of α-4T Polymorphs

Abstract: The oligomers of thiophene include some that are highly promising for application in thin film transistor devices. The properties of α‐quaterthiophene (α‐4T) have been investigated to see if it would also be suitable for such applications. The growth of crystals of α‐4T is described and the crystal structure data obtained from single crystals of two polymorphs are presented. The differences and similarities of the structure and electronic band structure of the two polymorphs are pointed out, including the expe… Show more

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Cited by 268 publications
(230 citation statements)
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“…The band line shape reflects the anisotropy of the known optical absorption of ͑001͒-oriented single crystalline thin films of ␣-4T with the structure of the low temperature ͑␣-4T / LT͒ polymorph having a monoclinic unit cell with parameters a = 6.09 Å, b = 7.86 Å, c = 30.48 Å, and ␤ = 91.8°. 5,[23][24][25] Indeed, the difference A ʈa ␣-4T − A Ќa ␣-4T between the absorbance for polarized light with the electric field parallel ͑ ʈ a ␣-4T ͒ and perpendicular ͑Ќa ␣-4T ͒ to the a ␣-4T axis, reported for such a single crystalline ␣-4T film in Fig. 2͑b͒, shows a positive band due to the strong absorption feature under ʈ a ␣-4T polarized light, negligible under Ќa ␣-4T polarized light; 24,25 hence, by the comparison between Figs.…”
Section: Dipartimento DI Scienza Dei Materiali and Cnism Università mentioning
confidence: 81%
See 1 more Smart Citation
“…The band line shape reflects the anisotropy of the known optical absorption of ͑001͒-oriented single crystalline thin films of ␣-4T with the structure of the low temperature ͑␣-4T / LT͒ polymorph having a monoclinic unit cell with parameters a = 6.09 Å, b = 7.86 Å, c = 30.48 Å, and ␤ = 91.8°. 5,[23][24][25] Indeed, the difference A ʈa ␣-4T − A Ќa ␣-4T between the absorbance for polarized light with the electric field parallel ͑ ʈ a ␣-4T ͒ and perpendicular ͑Ќa ␣-4T ͒ to the a ␣-4T axis, reported for such a single crystalline ␣-4T film in Fig. 2͑b͒, shows a positive band due to the strong absorption feature under ʈ a ␣-4T polarized light, negligible under Ќa ␣-4T polarized light; 24,25 hence, by the comparison between Figs.…”
Section: Dipartimento DI Scienza Dei Materiali and Cnism Università mentioning
confidence: 81%
“…It originates from the interference due to the crystal finite thickness ͑as indeed checked by measuring different TEN samples, not shown here͒. In the case under analysis this phenomenon is strongly limited due to a suitable choice of the TEN crystal substrate so thin that any complete fringes cannot be observed; in this way, after deposition of ␣-4T the anisotropy 23 of the film can be detected, if any.…”
Section: Dipartimento DI Scienza Dei Materiali and Cnism Università mentioning
confidence: 99%
“…The electronic band structure calculation methods were successfully applied to a number of organic semiconductor materials. 10,[24][25][26] Prior to the band structure calculations, the atomic positions obtained from X-ray diffraction measurement were optimized with a force tolerance of 10 meV/ Å. Some of the interatomic distances are listed in Table 3.…”
Section: Resultsmentioning
confidence: 99%
“…2 has been measured after 8 nm of 4T were deposited on KAP (in two steps, 4 nm each). It clearly shows the structure at about 3.6 eV characteristic of the 4T film grown on KAP at low substrate temperature [9] (close to that of the low temperature polymorph [10]), with (001) as contact plane. The dielectric response of crystalline 4T [9,11] permits assignment of this peak to a contribution of the dielectric function of mixed transversal-longitudinal character, while its negative sign suggests that the a 4T (b 4T ) axis of the 4T crystal in the film is aligned with the β(α) reference direction of the RAS apparatus.…”
Section: Resultsmentioning
confidence: 99%