Crystal Morphology Analysis of Piezoelectric Ceramics Using Electron BackScatter Diffraction Method and Its Application to Multiscale Finite Element Analysis

Abstract

Microstructural crystal morphology, which affects strongly on macroscopic electromechanical behaviors of polycrystalline piezoelectric ceramics, was analyzed using electron backscatter diffraction method. We coated piezoelectric ceramics with amorphous osmium to defend against electrification caused by electron beam, and measured crystal orientations of 140×120 µm 2 over region at 0.32 µm scanning interval. Then the obtained crystal orientations were applied to a multiscale finite element analysis to evaluate the relation with macroscopic mechanical and electrical properties. Especially, we investigated on finite element modeling conditions to sample crystal orientations, and presented a representative volume element of microstructure to compute the macroscopic homogenized properties and the microscopic localized responses.

A multiscale finite element simulation of piezoelectric materials using realistic crystal morphology

“…for PZT [13] Figure 8 shows the full components of macroscopic homogenized material properties obtained through the multiscale simulation using the SEM･EBSD-measured realistic microstructure in figure 7. The material properties of BaTiO 3 single crystal [14] were utilized for each element on the assumption that each grain is poled fully and it consists of a single domain.…”

“…In case of our previous study on BaTiO 3 [12], crystal orientation maps with high resolution couldn't be obtained because of the electrification of specimen. Additionally, in our previous investigation on PZT [13], the computations were carried out by using uncertain material properties to microstructural grains because single crystals are nonexistent and their material properties were unknown. In this paper, we retry to analyze the microstructure of BaTiO 3 by SEM･EBSD measurement.…”

Parallel iterative partitioned coupling procedure for multi-scale piezoelectric finite element analysis

“…We obtained distribution of crystal orientation in a 3-D parallelepiped box region of a BaTiO 3 ceramic (Murata Manufacturing Co. Ltd.) by using the EBSD (Oxford Instruments plc, Link ISIS C.7272) implemented in the SEM (JEOL Datum Ltd., JSM-5410) [5]. The specimen was a circular disk of 15mm diameter and 1mm thickness, and it was electrically poled along the thickness direction.…”

Electron backscatter diffraction crystal morphology analysis and multiscale simulation of piezoelectric materials

“…In our previous studies, we have analyzed the microstructure of BaTiO 3 [29,30] and PZT [31] by mean of EBSD. We focused on polycrystalline piezoelectric ceramics because they have most diffi cult microstructure for numerical modeling.…”