2021
DOI: 10.1039/d0ce01669a
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Crystal mosaicity determined by a novel layer deconvolution Williamson–Hall method

Abstract: The application of conventional Williamson-Hall plot (WH) analysis to crystals often results in broadenings not proportional to the scattering length vector. Several reasons may influence the broadening such as composition...

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Cited by 9 publications
(5 citation statements)
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“…Related to the former, it is first time the software is presented as final version to the scientific community. The latter, acronym for multiple reflection optimization package for XRD, in its single reflection mode has been often used for the simulation (and fitting) of the 2θ-ω scans using the dynamical theory of XRD [32][33][34][35][36][37][38] while the multiple reflection mode has been recently presented [38]. The code employs the dynamical theory of XRD and considers the effects of the instrumental function and the presence of Cu Kα 2 .…”
Section: Samples and Description Of The Experimental Techniquesmentioning
confidence: 99%
“…Related to the former, it is first time the software is presented as final version to the scientific community. The latter, acronym for multiple reflection optimization package for XRD, in its single reflection mode has been often used for the simulation (and fitting) of the 2θ-ω scans using the dynamical theory of XRD [32][33][34][35][36][37][38] while the multiple reflection mode has been recently presented [38]. The code employs the dynamical theory of XRD and considers the effects of the instrumental function and the presence of Cu Kα 2 .…”
Section: Samples and Description Of The Experimental Techniquesmentioning
confidence: 99%
“…The MROX code, as recognized software for the simulation of X-ray diffraction measurements, was used in X-ray diffraction single reflection mode. 53–58 The simulations considered pseudomorphic growth, i.e. , the Ge in-plane lattice parameter equals the ones from the Si substrate and Si buffer layer.…”
Section: Experimental Results and Mrox Simulationsmentioning
confidence: 99%
“…The MROX code, as recognized software for the simulation of X-ray diffraction measurements, was used in X-ray diffraction single reflection mode. [53][54][55][56][57][58] The simulations considered pseudomorphic growth, i.e., the Ge in-plane lattice parameter equals the ones from the Si substrate and Si buffer layer. Although the measured reflection is only sensitive in the orthogonal direction with respect to the surface, as it is only dependent on the c-lattice parameter, the calculated intensity is slightly affected by the volume of the unit cell which is different if the unit cell is relaxed or strained uniaxially.…”
Section: Crystengcomm Papermentioning
confidence: 99%
“…The crystal size and strain were calculated using the Williamson–Hall method. The Williamson–Hall (W–H) equation is obtained using the following formula: 29 …”
Section: Resultsmentioning
confidence: 99%