Titanium
nitride (TiN) is an emerging material for refractory plasmonics
owing to its excellent optical properties in the visible and near-infrared
regions, high melting temperature, extreme mechanical hardness, and
stability against material degradation in tough environments. Recently,
TiN plasmonic metasurfaces have been proposed as optical broadband
absorbers and narrow-band thermal emitters, which are critical for
high-efficiency solar thermophotovoltaics. Here, we demonstrate a
single-layer metasurface broadband absorber made from the oxidation-resistant
TiN(111) epitaxial film grown on c-plane sapphire by nitrogen-plasma-assisted
molecular beam epitaxy (MBE) with ∼90% absorptivity over the
visible spectrum. This is accomplished by optimized plasmonic characteristics
of the oxygen-free stoichiometric TiN film grown by MBE, in comparison
with titanium oxynitride (TiO
x
N
y
) films prepared by the conventional reactive sputtering
technique. In addition, the superb thermal and chemical stabilities
of MBE-grown TiN metasurface are confirmed by vacuum annealing at
850 °C and irradiation under 130 suns in the ambient environment.