Crystal subgrain misorientations observed by X-ray topography in reflection

Armstrong, Ronald W.; Boettinger, William J.; Kuriyama, M.

doi:10.1107/s0021889880012472

Cited by 42 publications

(3 citation statements)

References 8 publications

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“…A similar analysis to that described for zinc was reported for the preferred [010] orientation of crystal subgrain boundary misorientations in the solidification of nickel single crystals [25]. Figure 8 shows the diffraction geometry developed in a wave vector description of two subgrain reflections being obtained with an asymmetric crystal topography (ACT) system.…”

Section: X-ray Topography Of Symmetrical-tilt Crystal Subgrain Boundamentioning

confidence: 56%

Symmetry Aspects of Dislocation-Effected Crystal Properties: Material Strength Levels and X-ray Topographic Imaging

Armstrong

2014

Symmetry

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Several materials science type research topics are described in which advantageous use of crystal symmetry considerations has been helpful in ferreting the essential elements of dislocation behavior in determining material properties or for characterizing crystal/polycrystalline structural relationships; for example: (1) the mechanical strengthening produced by a symmetrical bicrystal grain boundary; (2) cleavage crack formation at the intersection within a crystal of symmetrical dislocation pile-ups; (3) symmetry aspects of anisotropic crystal indentation hardness measurements; (4) X-ray diffraction topography imaging of dislocation strains and subgrain boundary misorientations; and (5) point and space group aspects of twinning. Several applications are described in relation to the strengthening of grain boundaries in nanopolycrystals and of multiply-oriented crystal grains in polysilicon photovoltaic solar cell materials. A number of crystallographic aspects of the different topics are illustrated with a stereographic method of presentation.

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Section: X-ray Topography Of Symmetrical-tilt Crystal Subgrain Boundamentioning

confidence: 56%

Symmetry Aspects of Dislocation-Effected Crystal Properties: Material Strength Levels and X-ray Topographic Imaging

Armstrong

2014

Symmetry

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“…This is different from the case of the PO and PT twins, where a set oftopographs have zero displacement of domain images. Here, we do not intend to demonstrate the topographic characteristic of 120 ° domains, but we only take such domain structure as a example to provide a general way for calculation of the magnitude and direction of the image displacement related to any two misoriented domains [or even crystal subgrains (Armstrong, Boettinger & Kuriyama, 1980)], based on the Cartesian representations of the two misoriented reciprocal lattices and the direction of the incident beam. As the displacement vectors are determined, the orientation contrast in any reflections can be explained easily.…”

Section: ° Domains In Perovskite Crystalmentioning

confidence: 99%

Contrast of Ferroelastic and Ferroelectric Domains in White-Beam X-ray Topographs

Huang¹,

Jiang²,

Liu³

et al. 1996

J Appl Cryst

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White-beam synchrotron topography has been demonstrated to be well suited for observation of all kinds of ferroelastic and ferroelectric twin domains. It is found that the domains that are misorientated against each other always appear as orientation contrasts in the topographs, while the antiparallel domains with parallel lattices may show different diffraction intensity by the synchrotronradiation anomalous-scattering effect. Based on the reciprocal-lattice splitting and the diffraction geometry, a general method of determination of the image displacement associated with two misoriented domains is given to explain their orientation contrast. It is also revealed that the anomalous-scattering contrast of antiparallel domains arises from the anomalous-dispersion terms of the noncentrosymmetric atoms in the unit cell of ferroelectric crystals.strain and polarization senses and to detect symmetric aspects of ferroic twins in a set of reflections recorded simultaneously (Yao, 1992; E1-Korashy, Hou, Dudley & Phillips, Roberts, Sheffen-Lauenroth & Darn, 1987). Based on the extremely strong intensity and natural high collimation of SR, this technique may also be applicable for real-time observation of domain dynamics during the variation of sample environment . In this paper, we demonstrate the SR topographic contrast of several typical ferroelastic and ferroelectric domains, and describe the general mechanisms underlying the domain diffraction by continuous X-ray topography. In fact, the observed contrast features and the diffraction mechanisms presented apply not only to ferroelastic and ferroelectric domains, but also to all other kinds of twinnings or domains generated during growth, by mechanical load and phase transitions.

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“…However, even where the difference in orientation is in excess of several arc-minutes, simultaneous diffraction from more than one grain can be observed and analyzed quantitatively if the crystal is suitably oriented with respect to the beam, as has been done in figure 9 , where five grains can be distinguished. In such instances, the tilt of the individual grains and their orientation with respect to one another can be accurately determined from the clear displacement of the images of the various grains with respect to each other [ 16 ].…”

Section: Illustrative Examplesmentioning

confidence: 99%

Diffraction imaging (topography) with monochromatic synchrotron radiation

Steiner¹,

Kuriyama²,

Dobbyn³

et al. 1988

J. RES. NATL. BUR. STAN.

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Structural information of special interest to crystal growers and device physicists is now available from high resolution monochromatic synchrotron diffraction imaging (topography). In this review, the importance of superior resolution in momentum transfer and in space is described, and illustrations are taken from a variety of crystals: gallium arsenide, cadmium telluride, mercuric iodide, bismuth silicon oxide, and lithium niobate. The identification and detailed understanding of local variations in crystal growth processes are shown. Finally, new experimental opportunities now available for exploitation are indicated.

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Crystal subgrain misorientations observed by X-ray topography in reflection

Cited by 42 publications

References 8 publications

Symmetry Aspects of Dislocation-Effected Crystal Properties: Material Strength Levels and X-ray Topographic Imaging

Symmetry Aspects of Dislocation-Effected Crystal Properties: Material Strength Levels and X-ray Topographic Imaging

Contrast of Ferroelastic and Ferroelectric Domains in White-Beam X-ray Topographs

Diffraction imaging (topography) with monochromatic synchrotron radiation

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