Crystalline Si photovoltaic modules based on TiO₂-coated cover glass against potential-induced degradation

Potential-induced degradation in photovoltaic modules based on n-type single crystalline Si solar cells

“…2 shows the EL images for the module before and after the PID test ( À 1000 V at 85°C for 2 h). After PID occurred, the entire Si cell was homogeneously darkened, whereas the EL inactive darkened areas were partially observed in p-type Si PV modules [1,6,8,23]. This change in the EL images after the PID test also suggests different degradation mechanism between n-type and p-type Si PV modules.…”

“…The solar energy-to-electricity conversion efficiency (η) and the electroluminescence (EL) images of the modules before and after PID tests were measured, as have been reported in the previous paper [23]. Spectra of external quantum efficiency (EQE) for the modules were estimated with a spectral photocurrent response measurement system (Bunkoukeiki Co., Ltd., BQE-100L).…”

“…For instance, we have reported that PID can be significantly suppressed by using a acrylic-film as a front cover substrate [15], control of antireflection coating on the surface of crystalline Si solar cell [22], using TiO 2 -thin film coated on the inner side of the cover glass [23], and introducing a thin polyethylene (PE) film into a conventional p-type Si PV module [24]. These results imply possibilities of promising PID-resistant techniques.…”

Potential-induced degradation of Cu(In,Ga)Se2photovoltaic modules

“…The tests of modules are conducted by applying a voltage bias to cells (1) from the grounded Al frame of modules flooded with water on their cover glass side, 1) (2) from the grounded Al frames in damp heat, 3) or (3) from an Al plate placed onto their cover glass in dry environment. 17) In this work, we used the third way in order to obtain degraded samples. Note that this acceleration test is severe; in particular, modules fabricated from multicrystalline Si and thin-film a-Si cells show total failure after the test for 2 h and 3 days, respectively, which will be shown in Sect.…”

Relationship between cross-linking conditions of ethylene vinyl acetate and potential induced degradation for crystalline silicon photovoltaic modules

“…Aluminum plate method 28) is developed for screening appropriate module materials or module structures within very short time in comparison with chamber method or water-film method. In this study aluminum plate method was employed in order to study PID mechanism within short time.…”