1997
DOI: 10.1002/(sici)1099-159x(199709/10)5:5<309::aid-pip180>3.0.co;2-x
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Crystalline silicon photovoltaics: the hurdle for thin films

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Cited by 39 publications
(18 citation statements)
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“…Improved cell and module processing techniques have increased yield, the proportion of functioning units available at the end of the manufacturing process (YD) (Little and Nowlan, 1997;Sarti and Einhaus, 2002;Rohatgi, 2003). 9 Because post-wafer yield measures the final stages of the production process, firms incur the entire cost of modules they discard for mechanical or electrical reasons.…”
Section: Yieldmentioning
confidence: 99%
“…Improved cell and module processing techniques have increased yield, the proportion of functioning units available at the end of the manufacturing process (YD) (Little and Nowlan, 1997;Sarti and Einhaus, 2002;Rohatgi, 2003). 9 Because post-wafer yield measures the final stages of the production process, firms incur the entire cost of modules they discard for mechanical or electrical reasons.…”
Section: Yieldmentioning
confidence: 99%
“…However, although diamond Si has a fundamental (indirect) band gap of 1.12 eV [2], its optical (direct) gap is larger than 3 eV [3]; thus, Si is not a good absorber of sunlight [4]. As a result, the Si absorber layer must be sufficiently thick (usually > 100 μm) to absorb enough visible light, and it must be assisted by phonons, which significantly increases the cost of Si-based PV modules [5]. Because of this drawback, in the past several decades, significant effort has been devoted to the search of materials that have better absorption coefficients in the visible region.…”
mentioning
confidence: 99%
“…The indirect band gap of silicon E g = 1.12 eV measured at room temperature 3 is not too far from the optimal value. This is one of the prerequisites that led to the success of crystalline silicon technology on the photovoltaic (PV) market 4 . There is also a growing interest in thin-film silicon technology because of the high costs of silicon wafers 5,6 .…”
mentioning
confidence: 99%