Crystallinity Study of Cu Thin Film Deposited by Indigenously Developed DC Magnetron Sputtering Setup

Kundu, Susmita; Karmakar, S. N.; Taki, G. S.

doi:10.1002/masy.202100356

Cited by 5 publications

(1 citation statement)

References 29 publications

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“…where 𝜇 = 4𝜋 × 10 . The Cu coatings with different thicknesses on graphite surface were deposited by ion plating technology; the details can be seen in [34,35]. The thickness uniformity of the Cu coatings is examined using a JSM-7800F scanning electron microscope (JEOL Ltd., Tokyo, Japan) to minimize the influence of uneven coating thickness on RF conductivity results.…”

Section: 𝑄 =mentioning

confidence: 99%

Radio-Frequency Conductivity Evaluation Method Based on Surface/Interface Scattering of Metallic Coatings

Guo,

Wu,

Liu

et al. 2024

Coatings

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Developing non-destructive evaluation methods for the radio frequency (RF) conductivity of conductive coatings can accelerate the performance evaluation and development of wireless communication devices. By using a split-resonator cavity to compare 800 nm copper/graphite and 1000 nm copper/graphite, we found that the RF conductivity increased by 45.5% and 82.7%, respectively, from 15 GHz to 40 GHz (pure copper was −7.2%), indicating that the bulk materials analysis method is not suitable for coating materials. Combined with electromagnetic wave theory, we believe that the critical factor lies in the additional losses of the electromagnetic waves at the copper/graphite interface and substrate. Based on the skin depth theory, the concept of triple skin depth is proposed to calculate the power loss of copper/graphite at different frequencies, considering rough Peff (including the power loss of the rough surface, copper coatings, copper/graphite interface, and graphite) compared with smooth pure copper Pc. Combined with the relationship between RF conductivity and electromagnetic wave power loss, the conductivity of copper coatings σCu at different frequencies is obtained by analyzing the measured σeff. Compared with the roughness model, the calculation error decreased from 30% to below 7%. Our study provides a theoretical basis for the regulation of the RF conductivity of metal coatings at different frequencies.

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Section: 𝑄 =mentioning

confidence: 99%

Radio-Frequency Conductivity Evaluation Method Based on Surface/Interface Scattering of Metallic Coatings

Guo,

Wu,

Liu

et al. 2024

Coatings

View full text Add to dashboard Cite

show abstract

Manifestation on the choice of a suitable combination of MIS for proficient Schottky diodes for optoelectronic applications: A comprehensive review

Alan Sibu,

Gayathri,

Akila

et al. 2024

Nano Energy

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The structural characteristics of nano-copper thin films produced via laser-assisted electric wire explosion process

Jumaa,

Al Hilli,

Khudia

2024

J. Phys.: Conf. Ser.

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Due to the wide range of important applications, the metal and metal oxide nanoparticles have increasing demand, so that many methods and technologies attempted to produce it. The Electric Wire Explosion (EWE) method is the most established method to produce nanometals and metal oxides in the form of either powders or thin films. In this study, copper and copper oxide films were prepared via electric wire explosion method with a developed laser igniting spark gap switch. The Cu thin films were prepared at different explosion voltages (4, 5 and 7kV) and then their structural properties were studied. The results show that the produced copper/copper oxides nanoparticles of thin films increased as the exploding voltage increased. The XRD test shows that the films crystallite size increased as the exploding voltage increased. FE-scanning electron microscope (FE-SEM) images, are shows the decrease of grain size of thin films as the explosion voltage increase.

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Crystallinity Study of Cu Thin Film Deposited by Indigenously Developed DC Magnetron Sputtering Setup

Cited by 5 publications

References 29 publications

Radio-Frequency Conductivity Evaluation Method Based on Surface/Interface Scattering of Metallic Coatings

Radio-Frequency Conductivity Evaluation Method Based on Surface/Interface Scattering of Metallic Coatings

Manifestation on the choice of a suitable combination of MIS for proficient Schottky diodes for optoelectronic applications: A comprehensive review

The structural characteristics of nano-copper thin films produced via laser-assisted electric wire explosion process

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